WANG Yan-gang, Jones Steve, LIU Guo-you. Reliability Analysis of Power IGBT Modules[J]. Electric Drive for Locomotives, 2013,(1):5-9. DOI: 10.13890/j.issn.1000-128x.2013.01.005.
Firstly, the module concept, packaging procedures, reliability and failure rules was presented. Then, the standard tests methodologies for investigating module reliability including endurance and environment tests were discussed. Lastly, the main failure mechanisms such as wire bonds failure, chip metallization reconstruction, solder layer fatigue and substrate delamination were studied.