Lifetime Prediction of Power IGBT Module

WANG Yan-gang; Chamund Dinesh; LI Shi-ping; Jones Steve; DOU Ze-chun; XIN Lan-yuan; LIU Guo-you

doi:10.13890/j.issn.1000-128x.2013.02.004

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Lifetime Prediction of Power IGBT Module

更新时间：2021-12-13

- Lifetime Prediction of Power IGBT Module
- Electric Drive for Locomotives Issue 2, Pages: 13-17(2013)
- 作者机构：
  
  1. 株洲南车时代电气股份有限公司功率半导体研发中心
- 作者简介：
- 基金信息：
- DOI：10.13890/j.issn.1000-128x.2013.02.004
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WANG Yan-gang, Chamund Dinesh, LI Shi-ping, et al. Lifetime Prediction of Power IGBT Module. [J]. Electric Drive for Locomotives (2):13-17(2013)
DOI：

WANG Yan-gang, Chamund Dinesh, LI Shi-ping, et al. Lifetime Prediction of Power IGBT Module. [J]. Electric Drive for Locomotives (2):13-17(2013) DOI： 10.13890/j.issn.1000-128x.2013.02.004.

摘要

介绍了功率循环试验数据的威布尔分析方法，分析了现有的典型模块寿命模型，论述了寿命预测的方法：将任务曲线转化成温度曲线，利用雨流计数法，根据线性疲劳损伤积累理论和寿命模型计算功率循环寿命。最后，预测了应用于HXD1C 电力机车的株洲南车时代电气股份有限公司3 300 V/1 200 A IGBT 模块的功率循环寿命。

Abstract

The Weibull methodology for power cycling test data and some reported typical lifetime models were firstly discussed. Then, lifetime prediction procedures were presented including the conversion of mission profile to temperature profile, the temperature cycles counting by Rainflow algorithm, and lifetime calculating based on the fatigue linear accumulation damage theory and lifetime models. Lastly, as an example, power cycling lifetime of 3 300 V/1 200 A IGBT modules manufactured by Zhuzhou CSR Times Electric Co., Ltd., subjected to the application of HXD1C locomotive was predicted.

关键词

IGBT 模块可靠性功率循环试验失效机制寿命预测

Keywords

IGBT modulereliabilitypower cycling testfailure mechanismlifetime prediction

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